Strada Atomistilor 409
The main objective of INDICO http://www.indico.inoe.ro/ (site to be upgraded soon) is to characterize by optical and complementary methods of materials, components and systems with application in optoelectronics, according to the objective of the Excellence Research Program, which states the development of experimental and testing laboratories and of certification authorities according to the requirements of the European Union regarding conformity evaluation to technical regulations. INDICO provide services of evaluation of the conformity according to the harmonized European standards, associated to the required directives both to the public authorities supervising the market and to the manufacturers to fulfill their objectives. We provide innovative services of characterization of materials, optical fibers, optical amplifiers, optical components and lasers in an integrated form that assure a continuity in the applied research/manufacture activities, leading to the achievement of products vendible in Romania and EU. The methods used refer to the measurement of the specific optical parameters for optoelectonic applications (identification and characterization of the composition of some materials used in optoelectronics, measurement of the output level in optical fibers and amplifiers, laser emitted energy, laser pulse width, laser beam diameter, intensity distribution, deviation from the Gaussian form, divergence, polarization etc.). The measurement of the components parameters underlaying optoelectronic systems and parts is necessary to accomplish devices that incorporate lasers, optical fibers, optical amplifiers, optoelectronic materials, according to European standards of quality. The achievements of INDICO creates in Romania and EU the necessary frame for manufacture of components and systems according to the quality certification requirements of EU. The achievement and the certification of INDICO reached an European level of examinations asked by juridical and physical persons interested in optoelectronic devices. The activities assigned to INDICO refer to: the development of the technical capability of INDICO by efficient equipments acquisition, the elaboration of the documents of the Quality Management System for the laboratory; the elaboration, testing and functionality demonstration of the testing methods, personnel training in quality management, the demonstration of implementation of the new methods by internal/external audit.
INDICO is a part of ACTRIS http://www.actris.eu/
INDICO - Lidar Calibration Centre (LiCal) - LiCoTest: proveding servises for the entire ACTRIS network http://www.actris.eu/Projects/ACTRIS2IAinH2020(20152019)/Partners.aspx
ACTRIS is the European Research Infrastructure for the observation of Aerosol, Clouds, and Trace gases. ACTRIS is composed of observing stations, exploratory platforms, instruments calibration centers, and a data centre. ACTRIS serves a vast community working on models and forecast systems by offering high quality data for atmospheric gases, clouds, and trace gases.
LASER ENERGY / POWER
One of the most important characteristic of a laser source is its energy (for a pulsed laser) or its power (for a CW laser). Measurements can be done at high acquisition rates allowing thus an accurate determination of pulse-to-pulse energy fluctuation. All measured data are stored and processed to get statistics (average, standard deviation, RMS, maximum, minimum, peak-to-peak).
LASER BEAM PROFILE
A more precise diagnostic of a laser source requires an analysis of the laser beam profile. A laser beam profiler provides important information characterizing the laser, as the energy (pulsed lasers) or power (CW lasers) distribution in a cross section of the laser beam, the waist of the beam, its divergence and M2 factor (that quantifies the beam quality of laser beams).
LASER PULSE WIDTH
Temporal behavior of the pulsed lasers is characterized by the pulse width (duration). Because the commercially available lasers have pulse widths of few ns, the pulse width measurement requires both a wide band oscilloscope and an ultrafast photodiode.
FT OPTICAL SPECTRUM ANALYSIS
Some lasers need to be verified from the point of view of the emitted optical spectrum. Depending on the spectral domain two Fourier Transform optical spectrum analyzers can be used: ThorLabs OSA 201 (Fourier Transform Optical Spectrum Analyzer, 350 - 1100 nm) or ThorLabs OSA 202 (Fourier Transform Optical Spectrum Analyzer, 600 - 1700 nm).
POLARIZATION STATE ANALYSIS
Polarization analysis provides besides classic polarization measurements also evaluation of optical components with the Jones or Mueller matrix algorithm. It can be also used for determining the Extinction Ratio.
MOELLER-WEDEL OPTICAL DEVICE MELOS 530-3
Focal lengths (effective and back focal length)
GONIOMETER MOELLER-WEDEL MODEL GONIOMETER II-VIS
The angles of prisms and refractive index of the glasses.
INTERFEROMETER MOELLER-WEDEL, MODEL VI-DIRECT SL 100 AND THE SOFTWARE INTOMATIK-S
Flatness determination and fringe evaluation (optical components).
MM1-300/6X GARANT MEASURING MICROSCOPE WITH INCREMENTAL MEASURING SYSTEM, IMAGE PROCESSING
Incident light: 56 white LEDs in 2 concentric rings. 1 ring and 4 segments can each be separately switched and dimmed. Transillumination: LED, telecentric, can be switched and dimmed. Solid granite base with steel cross table, surface hardened mounted on precision needle bearing. Diode laser as positioning guide.
MOELLER-WEDEL OPTICAL ELCOMAT VARIO D 500T/65 ELECTRONIC AUTOCOLLIMATOR
Set/determine the perpendicularity to a given surface.
Spectral analysis of materials is mainly useful to characterize thin films, as optical coatings, but may extend also to bulk or liquid materials.
PERKINELMER LAMBDA 1050 UV/VIS/NIR SPECTROPHOTOMETER
The measurements comprise spectral characterization of optical coatings or thin film filters in a wide spectral range
HORIBA JOBIN IVON UVISEL ELLIPSOMETER
From thin to thick layers, with or without a transparent substrate, in the fields of semiconductors, flat panel displays, optoelectronics, photovoltaics, and optical and functional coatings, it is the best solution for precise characterization of thin film structures.
Links (site to be upgraded soon):
Laser beam characterization methods
Optical components characterization methods
Materials optical characterization methods
Laser energy,power, beam profile, pulse width;
Optical spectrum analysis;
Polarization state analysis;
Optical components characterization: includes focal lengths (effective and back focal length), angle of prisms and flatness of plane surfaces (not only optical);
Materials: Spectral analysis;
Thin films optical characterization;